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focused-ion-beam scanning electron microscope (sem) fei helios nanolab 600  (NanoLab Inc)

 
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    NanoLab Inc focused-ion-beam scanning electron microscope (sem) fei helios nanolab 600
    Focused Ion Beam Scanning Electron Microscope (Sem) Fei Helios Nanolab 600, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/focused-ion-beam scanning electron microscope (sem) fei helios nanolab 600/product/NanoLab Inc
    Average 90 stars, based on 1 article reviews
    focused-ion-beam scanning electron microscope (sem) fei helios nanolab 600 - by Bioz Stars, 2026-02
    90/100 stars

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